Skip to main content

ieee top header menu

IEEE.org
IEEE Xplore Digital Library
IEEE Standards
IEEE Spectrum
More Sites

Anonymous user menu

Cart
Create Account
Sign In

Conferences
CAMA 2016
2020 AP Symposium
Education
Antennas
Computational EM
Electromagnetic Theory
RF and Microwave Systems
Propagation
Professional Development
Interviews
Leave this field blank

IEEE APS Resource Center

APS Home

wearable strain

A General Scattering Algorithm for Dielectric and PEC Random Rough Surfaces

24 Oct 2016

A General Scattering Algorithm for Dielectric and PEC Random Rough Surfaces

APS

Members: Free
IEEE Members: $11.00
Non-members: $15.00

Subscribe to wearable strain

Become an APS Member

Enhance your education and professional development. Join the IEEE Antennas and Propagation Society to access valuable content on the APS Resource Center.
Get Started »

IEEE Home Contact & Support Accessibility Nondiscrimination Policy IEEE Ethics Reporting IEEE Privacy Policy Terms

© Copyright 2024 IEEE – All rights reserved. A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.