Influence of the Probe when Computing Far Field from Near Field Measurements M Salazar Palma DOI 10.17023/msnh-3w07 APS Members: Free IEEE Members: $11.00 Non-members: $15.00 Pages/Slides: 23 24 Oct 2016 Tags: higher order finite element method IEEE 2016 cama slides hofen aps m salazar palma simulator antenna analysis
24 Oct 2016 Tags: higher order finite element method IEEE 2016 cama slides hofen aps m salazar palma simulator antenna analysis